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TRIOPTICS
Optical Instruments

Technical Objectives

Index
General Aspects
Measurement of the topography of flat and slightly unflat surfaces
Technical and Scientific Objectives
Innovative Aspects
Main Project Output

General Aspects

The problem of topometric absolute measurement of surfaces is not satisfactorily solved. Techniques such as interferometry, wavefront sensorics or triangulation measure relative to a "known" reference surface. These methods of measurement are thus limited by the accuracy of the reference. The quality of complex optical systems decisively depends on the agreement between the individual optical surfaces and the desired shape. While spherical surfaces today can be fabricated and measured with accuracies of up to a few nanometres, the fabrication of other surfaces is limited by the measuring technology available. Here, interferometry up to now has furnished only relative but no absolute results. Precise surface manufacturing requires precise measuring techniques. This means deviations of artefacts from the desired shape in orders of nanometres. The test piece dimensions may cover diameters of up to a few hundred millimetres, and the surfaces may have the shape of flat and slightly unflat surfaces. The geometry of the test pieces, their mechanical holder, the influence of gravitation, and temperature influences may have an effect on the surface shape. It must be guaranteed that a sufficiently high reproducibility allows the required measurement uncertainty to be achieved and that subsequent use of the test pieces with the required specification will be possible at all. The answer to the question to which reference the measurement is traced back is decisive for the measurement accuracy which the method can claim to achieve. Examples are solid references, mathematically ideal virtual references, scanning techniques, and, in particular, procedures without reference, such as difference methods.

Measurement of the topography of flat and slightly unflat surfaces

The measurement of flat and slightly unflat surfaces with an uncertainty of some nanometres for the topography poses considerable problems. In the following measuring procedures are discussed which are counted among those eligible for such a measuring technology. Table 1 shows the measurands to be measured and, furthermore, the base quantities for the traceability as well as problems and advantages are stated. In interferometry high measurement range can be mastered only with a reference, i.e. a suitable prototype. This prototype is also the reference required for interferometry, probably a plane. For coordinate measuring machines, several plane references are needed for the measurement of which measuring means with the necessary accuracy are not available either. Further decisive errors are the Abbe error for the scanning of the test specimen and support on the reference, and particularly a whole-body movement of the test specimen with respect to the measuring facility or by deformation of the measuring facility itself, for example due to temperature influences. Whole-body movement and the deformation of the measuring facility are other decisive influences for high-accuracy measurements.

Measuring Method Reduction of measurement range by: Traced back to Problems Advantages
Topography Interferometer matched reference Length Reference available, mathematical permutation possible 2 D, fast
Topography CMM, length measurement not necessary Length References, Abbe error, whole body movement Nearly unlimited measurement range
Slope ACT, angle measurement first derivative Angle Strong curvature, whole body movement Very high reproducibility
Curvature Various matched adjustment and second derivative Various Scaling factor High reproducibility
Slope difference ACT, angle measurement matched adjustment and matched shears and first derivative Angle, length Very strong curvature Very high reproducibility

Methods for measuring flat and slightly unflat surfaces.

For angle measuring procedures, a very high reproducibility and a reduction of the measurement range by the first derivation can be observed. For procedures of direct curvature measurement, different possibilities of measuring the local curvature are imaginable. The measurement range is reduced by the second derivation of the topography but it is also decisively lessened by the possibility of placing the surface element whose curvature is to be measured vertical to the measuring facility in any location of the test specimen. This is possible for the measurement of curvature because curvature of the test specimen is a quantity which is independent of the local and angular position of the test specimen. A further procedure will be discussed, namely the measurement of angles (slopes) and of angle (slope) differences with large shears. In the latter case the measurement range is decisively reduced by the possibility of placing test specimen and measuring facility vertical to each other because the local and the angular positions of the test specimen are not of importance in the measurement of angle differences. At the same time, the selection of the shear allows the measured angle differences to be adapted to the necessary measurement range so that large measuring signals are obtained compared with the small measuring signals in direct curvature measurements. These procedures have the advantage not only of large measuring signals but also of very high reproducibilities. Furthermore, whole-body movements and deformations of the facility have no influence unless they occur during the very short time the difference measurement takes. Moreover, the difference measurement and thus the error separation can serve to eliminate the residual first and second-order error influences of the facility. In summary it may be said that this technique combines the following properties: very high reproducibility, adapted reduction of the measurement range, no influence of whole-body movements of the test specimen, no influence of deformations of the facility, elimination of errors of the facility by error separation.

In conclusion, techniques for measuring slopes and slope differences are most favourable and will be discussed, proposed and followed in this project.

Technical and Scientific Objectives

The objective of the project is innovative instrumentation based on slope vector measurement (the deflectometric principle). Application of this instrumentation is measuring 3D topography which fulfils the requirements of in line production control in the semiconductor industry, the LCD glass and the LCD industry, and which suits the needs of the optical industry in the production of flat or slightly unflat advanced optical components. In particular the aims are:

  • Development of optical scanning hardware, using a scanning mirror for 3D deflectometry, aiming at very short measuring time of ~ 1 minute and accuracy of better than 10nm, lateral sampling of 400 mm. However optical scanning is limited to an area of 300 - 500 mm diameter, mainly aiming at in line measurement of silicon wafers.
  • Mechanical stage scanning of very large specimen, up to 600 x 1000 mm2 glass plates and optical elements. Scanning time < 5 minutes and accuracy 10nm. mechanical stage scanning will be assessed in its basic form, and also with a shear for eliminating scanning stage errors.
  • Deflectometric algorithms for retrieving full 3D topographic information from slope vector information. These algorithms serve both scanners, as their principle is identical.
  • Description of 3D topography and efficient user interface.
  • Innovative Aspects

    Deflectometry is a new concept for measuring topography, which is not yet in use, except for one 2D application used for inspection of synchrotron optics. Fast deflectometric scanning over a full surface and capturing 3D topography would be an important innovation. Six distinct innovations are aimed at:

  • Very fast optical scanning, using a scanning mirror and very fast 2 dimensional detectors for measuring the complete slope vector combined with fast electronics for dynamic correction of errors of the scanning system.
  • Optical scanning is new for deflectometry. Anticipated scan over a 300mm line in 0.01 - 0.001 seconds.
  • Fast scanning of large surfaces based on mechanical stage scanning. Shear for eliminating stage errors in deflectometry is new in deflectometry. Anticipated scan over 1000 mm in 3 seconds.
  • Algorithms for fast retrieval of 3D topography data from measured slope vector data. Up to now retrieving 3D topographic information from slope vector measurements has not been solved adequately.
  • Data condensing and reduction. New descriptions of 3D surfaces have to be generated and incorporated during the project.
  • Effective user interface.
  • Main Project Output

    Main output of the project will be new measurement instrumentation based on 3D deflectometry for measuring unflatness of virtually flat industrial surfaces.

  • Advanced 3D deflectometric hardware with optical scanning for measurement of substrates up to 300 mm diameter with 10nm accuracy in less than 1-3 minutes.
  • Advanced 3D deflectometric hardware with mechanical stage scanning for measurement over 600 x 1000 mm2 with 10nm accuracy in less than 30 minutes (off line) and – depending on sampling - in about 3 - 5 minutes.
  • Very fast 2 dimensional detectors for measuring the complete slope vector and its associated fast electronics, which serve both scanning approaches, at least at > 0.1 – 1 Msamples/s.
  • Algorithms for reconstructing 3D surface shape from slope vector signals, which will serve both complementary hardware approaches.
  • New descriptions of 3D surfaces, based upon slope and slope difference data.
  • Effective display software and user interface.
  • Application know-how at future end user industries: Measurement of large and flat substrates in various industrial applications such as silicon wafers for Integrated Circuit manufacturing, optical components, glass substrates for professional optical data storage.
  • Suggestions for new ways of specifying and tolerancing flat substrates.