Technical and scientific references

Optical figure testing by scanning deflectometry,: Amstel, W.D. van, Bäumer, S.M.B., Horijon, J.L., Proc. SPIE, 3739 (1999) 283-290.
Mini-deflectometer for measuring optical finish quality,: Amstel, W.D. van, Bäumer, S.M.B., Couweleers, F.C., Proc. SPIE, 3739 (1999) 363-368.
Ultra-Precise Scanning Technique for Measurement of Topographies in the Nanometric Range,: I. Weingartner, M. Schulz, Proceedings of the 1st International Conference and General Meeting of the European Society for Precision Engineering and Nanotechnology, 2 (1999) 126-129.
Novel scanning technique for ultra-precise measurement of slope and topography of flats, spheres and aspheres,: I. Weingärtner, M. Schulz, Proceedings Europto Series, Optical Fabrication and Testing, 3739 (1999) 274-282.
Verfahren zur Rekonstruktion von optischen, mechanischen, elektrischen oder anderen Meßgrößen,: C. Elster, S. Loheide, I. Weingärtner, German patent, (1998) 198 29 382.8.
Exact wave-front reconstruction from two shearing interferograms,: C. Elster, I. Weingärtner, J. Opt. Soc. Am., 16 (1999) 2281-2285.
Solution to the shearing problem,: C. Elster, I. Weingärtner, Appl. Optics, 38 (1999) 5024-5031.